Ewelina Mistek Receives FACSS Student Award
Ewelina Mistek is the 2019 winner of the FACSS Student Award, which will be presented to her on Sunday, October 13, at the SciX 2019 conference, in Palm Springs, California.
Ewelina Mistek
Ewelina Mistek is the 2019 winner of the FACSS Student Award, which will be presented to her on Sunday, October 13, at the SciX 2019 conference, in Palm Springs, California.. The FACSS Student Award is presented to outstanding graduate students who wish to attend and present their work at the SciX conference.
Mistek is a PhD student in chemistry at the University at Albany, State University of New York. She is a National Institute of Justice Graduate Research fellow. Originally from Bukowno, a small village in Poland, Mistek earned an Academy Profession Degree in Chemical and Biotechnical Science from the Business Academy Aarhus at the University of Applied Sciences in Denmark. Her work focuses on the application of vibrational spectroscopy and statistical data analysis for the development of new forensic methods with a concentration on the identification and characterization of body-fluid traces.
Mistek has published seven articles in peer-reviewed journals, including five first-author papers, and one book chapter. She has presented her research at 18 local, national, and international conferences. Recently, she was elected to the position of Student Representative of the Society for Applied Spectroscopy.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
