International Centre for Diffraction Data
Company Description
ICDD is a non-profit scientific organization dedicated to collecting, editing, publishing, and distributing powder diffraction data for the identification of crystalline materials. Our mission is to continue to be the world center for quality diffraction and related data to meet the needs of the technical community. We promote the application of materials characterization methods in science and technology by providing forums for the exchange of ideas and information. We sponsor the Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD); the Denver X-ray Conference; its proceedings, Advances in X-ray Analysis; and the journal Powder Diffraction. ICDD and its members conduct workshops and clinics on materials characterization at our headquarters in Newtown Square, Pennsylvania, and at X-ray analysis conferences around the world.
Chief Spectroscopic Techniques Supported
- X-ray Diffraction
- Electron Diffraction
- Electron Backscatter Diffraction
- Neutron Diffraction
- Synchrotron Diffraction
Markets Served
The Powder Diffraction File™ is designed for materials identification and characterization. ICDD databases are used worldwide by scientists in academia, government, and industry who are actively engaged in the field of X-ray powder diffraction and related disciplines.
Major Products/Services
PDF-4+ is designed to support rapid phase identification and quantitative analysis by providing key reference data required for these analyses. It combines the world's largest sources of inorganic data from crystals and powders into a single database. PDF-4+ contains an array of tools, including a full suite of data simulation programs enabling the analysis of neutron, electron, and synchrotron data, in addition to X-ray. PDF-4+ features digitized patterns, molecular graphics, and atomic coordinates to enhance the ability to do quantitative analysis by any of three methods: Rietveld Analysis, Reference Intensity Ratio (RIR) Method, or Total Pattern Analysis.
International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073
TELEPHONE
(610) 325-9814
Toll Free U.S.:
(866) 378-9331
FAX
(610) 325-9823
E-MAILinfo@icdd.com
WEB SITEwww.icdd.com
YEAR FOUNDED
1941
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
