Lester W. Strock Award to Be Presented to S. Michael Angel at SciX 2019
S. Michael Angel, a professor of chemistry at the University of South Carolina (Columbia, South Carolina), will be presented with the Lester W. Strock Award on Tuesday, October 14, at SciX 2019, in Palm Springs, California.
S. Micheal Angel
S. Michael Angel, a professor of chemistry at the University of South Carolina (Columbia, South Carolina), will be presented with the Lester W. Strock Award on Tuesday, October 14, at SciX 2019, in Palm Springs, California. The award is given by the New England Section of the Society of Applied Spectroscopy in recognition of a selected publication of substantive research or application of analytical atomic spectrochemistry in the fields of earth science, life sciences, or stellar and cosmic sciences.
Angel received his PhD from North Carolina State University and carried out postdoctoral work at the Lawrence Livermore National Laboratory (Livermore, California). His research group focuses on the areas of remote and in situ laser spectroscopy with a focus on deep-ocean, planetary, and homeland security applications of Raman and laser-induced breakdown spectroscopy (LIBS). Among the group’s recent work is the development of a spatial heterodyne Raman spectrometer (SHRS), and exploration of miniature SHS spectrometers for deep UV Raman, remote Raman, and LIBS, underwater LIBS, and for use on future planetary landers and SmallSats.
To see Spectroscopy’s interview with Angel on developing spectroscopy instruments for use in extreme environments, please click here.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
