New ASTM Method Uses ICP–AES to Determine Composition of Aluminum Alloys
ASTM’s committee on analytical chemistry for metals, ores, and related materials has developed a new method for analyzing the composition of aluminum and aluminum alloys.
ASTM’s committee on analytical chemistry for metals, ores, and related materials has developed a new method for analyzing the composition of aluminum and aluminum alloys. The test will help manufacturers, consumers, and laboratories verify that an alloy’s composition is within the needed limits through inductively coupled plasma–atomic emission spectrometry (ICP–AES). This method will soon be published as E3061, Test Method for Analysis of Aluminum and Aluminum Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance Based Method).
The new method is performance based, but it also provides established preparation and analysis techniques. Additionally, the standard establishes expected repeatability of this method.
“The composition of an aluminum alloy is one factor that determines the final properties of the metal, such as strength, hardness, and durability,” said ASTM member Jeneé Jacobs. He noted that ICP–AES is currently being used in many laboratories as a replacement for wet chemistry techniques and other outdated analytical methods.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
