Orbis micro-XRF Inorganic Elemental Analyzer System

September 10, 2008

EDAX Inc. has introduced the Orbis micro-XRF inorganic elemental analyzer system, setting a new standard in analytical flexibility.

EDAX Inc. has introduced the Orbis micro-XRF inorganic elemental analyzer system, setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret for coaxial sample view and X-ray analysis. Primary beam filters can be used with X-ray optics for tailored micro-spot analyses. Orbis micro-XRF measurements are non-destructive, require minimal sample preparation and offer improved sensitivity over SEM/EDS. Applications include forensics, materials identification/compositional analysis, failure analysis, RoHS/WEEE, non-destructive testing, elemental imaging, and more. EDAX, Inc., Mahwah, NJ; www.edax.com/neworbis