Rigaku and the University of Tokyo Establish Collaboration Center Focused on X-ray Diffraction
Rigaku (The Woodlands, Texas) and the University of Tokyo (Tokyo, Japan) held a ceremony on January 25, 2012 to celebrate the establishment of an Industry-Academia Collaboration Center at the university.
Rigaku (The Woodlands, Texas) and the University of Tokyo (Tokyo, Japan) held a ceremony on January 25, 2012 to celebrate the establishment of an Industry-Academia Collaboration Center at the university. The ceremony, originally scheduled for August of 2011, was postponed in the wake of Japan’s devastating earthquake. The center was established in April 2011 between Rigaku and the Institute of Engineering Innovation in the School of Engineering at the university.
The purpose of the center is to further establish X-ray diffraction as a leading measurement technology by putting the latest technology in the hands of academic researchers. The Institute of Engineering Innovations pursues research in the design and characterization of new materials and uses a variety of X-ray techniques in analyzing the correlation between atomic level structure and functional characteristics. As part of the collaboration, Rigaku has installed two of its diffractometers in the center—one configured for thin film analysis, and one configured for extreme high resolution measurements.
The Industry-Academia Collaboration Center aims to foster education in the area of nanotechnology by giving students and researchers state-of-the-art instrumentation, and providing these resources not only to researchers at the University of Tokyo, but also allowing researchers throughout Asia and the world to use the new technology.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
