Supplementary Information: Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS

August 28, 2017

Steve Wilbur, Michiko Yamanaka, Ed McCurdy

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue "Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists" to Spectroscopy.

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists to Spectroscopy (1).

Reference

E. McCurdy, M. Yamanaka, and S. Wilbur, Spectroscopy32(s9), 27–34 (2017).