Supplementary Information: Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS

Article

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue "Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists" to Spectroscopy.

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists to Spectroscopy (1).

 

 

Reference

  • E. McCurdy, M. Yamanaka, and S. Wilbur, Spectroscopy32(s9), 27–34 (2017).
Related Videos
John Burgener | Photo Credit: © Will Wetzel
Robert Jones speaks to Spectroscopy about his work at the CDC. | Photo Credit: © Will Wetzel
John Burgener | Photo Credit: © Will Wetzel
Robert Jones speaks to Spectroscopy about his work at the CDC. | Photo Credit: © Will Wetzel
John Burgener of Burgener Research Inc.