Author | Michiko Yamanaka

Articles

Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS

September 01, 2017

Special Issues

Article

A method to measure ultrafine silica nanoparticles using ICP-MS/MS to control the elemental and polyatomic ion backgrounds is described here.

Supplementary Information: Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS

August 28, 2017

Article

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue "Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists" to Spectroscopy.

Automated, High Sensitivity Analysis of Single Nanoparticles Using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

July 20, 2015

Spectroscopy

Article

Characterization of nanoparticles (NPs), including samples containing different sized NPs is described using ICP-MS. New integrated data analysis software is capable of quickly and automatically performing the complex calculations required for the analysis of single particles, while permitting simple, visual optimization and validation of results. The method provides a combination of particle size distribution and sample concentration information that is generally not available with other techniques.