Michiko Yamanaka

Method development for ICP-MS/MS should not be difficult. The six steps here will guide you to success.

A method to measure ultrafine silica nanoparticles using ICP-MS/MS to control the elemental and polyatomic ion backgrounds is described here.

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue "Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists" to Spectroscopy.

Characterization of nanoparticles (NPs), including samples containing different sized NPs is described using ICP-MS. New integrated data analysis software is capable of quickly and automatically performing the complex calculations required for the analysis of single particles, while permitting simple, visual optimization and validation of results. The method provides a combination of particle size distribution and sample concentration information that is generally not available with other techniques.