Ed McCurdy

Sulfur (S) is one of a small group of elements that have historically been difficult to analyze at low levels using conventional inductively coupled plasma–mass spectrometry (ICP-MS). Accurate low-level analysis of sulfur is required in applications in life science, clinical research, pharmaceutical development, food safety, environmental monitoring, geochemistry, and petrochemistry. ICP-MS analysis of sulfur is problematic because of the element’s high first ionization potential, which reduces sensitivity. Also, intense polyatomic interferences affect all the isotopes of sulfur. Background levels are also often high, due to the presence of S in many components used in laboratory equipment. ICP-MS fitted with a collision/reaction cell can use oxygen (O

) 48, avoiding the on-mass interferences at 

 32. However, mass 48 can also be affected by interference from 

, as well as from overlapping product ions such as 

. Also, applications such as isotope ratio measurements and isotope dilution mass spectrometry (IDMS) require the accurate determination of a minor isotope, 

S. We describe how tandem mass spectrometry (MS/MS) controls the O

 reaction gas chemistry to resolve multiple spectral overlaps on all the sulfur isotopes. Combined with appropriate selection of instrument components to reduce the sulfur background, MS/MS can provide accurate low-level analysis of sulfur and sulfur isotope ratios in aqueous and organic matrices.

Inductively coupled plasma–mass spectrometry (ICP-MS) is widely used for multielement analysis of trace analytes in a wide variety of sample types. A few elements, including sulfur (S), are difficult to measure using conventional (single)
quadrupole ICP-MS.

Applications that require low level sulfur analysis include petrochemical analysis (1,2), the study of biomolecules (such as proteins) in life science research (3,4), detection of sulfur compounds in foods (5), and development of sulfur-based pharmaceuticals (6,7). Accurate determination of sulfur at low concentrations is affected by several factors:

1.Sulfur has a high first ionization energy (or ionization potential) of 10.36 electron volts (eV), meaning it is only around 10% ionized in a normal ICP plasma. This translates into 10x lower sensitivity than for a fully ionized element.

S, 95.04% abundance) suffers intense background overlap from polyatomic ions including 

, making trace analysis impossible by conventional quadrupole ICP-MS.

S, accounts for only 4.2% of total sulfur, meaning a further reduction in sensitivity by a factor of more than 20. This isotope also suffers from intense background interferences, as does the final potentially useful isotope, 

S (0.75% abundance). The fourth naturally occurring isotope, 

S, is only 0.015% abundant, and is overlapped by a minor isotope of argon. The most significant background polyatomic ions that overlap the isotopes of sulfur are shown in Table I.

4.Sulfur is present in many laboratory reagents and components, causing background contamination.

The commercial development of collision–reaction cells (CRCs) for ICP-MS in 1997 (8) provided analysts with a novel approach to controlling interferences, solving many of the problematic spectral overlaps that had hampered ICP-MS analysis (9,10). However, a small number of analytes, including sulfur, remained difficult to determine at low concentrations.

Approaches to improve the detection of sulfur have included the use of xenon (Xe) cell gas to reduce the intensity of the 

 interference by collisional dissociation and charge transfer (11), and sector field high resolution ICP-MS to mass resolve the O

 (4), However, the use of xenon cell gas does not give low enough detection limits for trace sulfur analysis, and sector field ICP-MS suffers from poor abundance sensitivity (peak tailing), which compromises the separation of the trace 

S+ peak from the much more intense neighboring 

) cell gas can be used in the CRC of a single quadrupole ICP-MS instrument to promote the formation of SO

 cell gas, so S+ can be mass-shifted away from the original O

 product ion masses are overlapped by existing ions, including 

. This approach is therefore not suitable for samples that might contain these other interfering elements, such as high Ca mineral waters and other environmental materials, or organic-based samples in petrochemical and life sciences applications (13).

Analysis of sulfur isotope abundance is of interest in several applications in environmental science, geochemistry, and hydrogeology. Such analysis requires interferences to be resolved on at least one of the minor isotopes of sulfur, 

S isotope. Minor isotopes must also be measured accurately to quantify sulfur using isotope dilution. CRC methods using O

 cell gas with single quadrupole ICP-MS (with or without a bandpass cell) cannot control the formation of interisotope overlaps such as 

, so accurate isotope ratio and isotope dilution analysis that requires analysis of 

S is impossible. Potential matrix-based and interisotope overlaps on the SO

 product ion masses are shown in Table II.

The development of triple quadrupole ICP-MS (ICP-QQQ) in 2012 (14) offered a way to address the limitations of reaction mode methods on single quadrupole and bandpass ICP-MS. ICP-QQQ uses an additional quadrupole mass filter (Q1) before the CRC, allowing tandem mass spectrometry (MS/MS) operation. In MS/MS, Q1 functions as a 1 u mass filter to select the specific mass that is passed to the cell. This excludes any ions that might be present at the mass where analyte product ions would appear (15). As each analyte precursor mass is passed to the CRC while excluding all other masses, ICP-MS/MS also resolves interisotope overlaps so accurate isotope ratio and isotope dilution analysis is straightforward. We investigate the potential interferences on sulfur from several common matrix elements and demonstrate ICP-MS/MS conditions that resolve the interferences on the sulfur isotopes of interest. We compare these results with operating the ICP instrument without MS/MS (Q1 >1 u mass window), and show examples of applications where complete resolution of the interferences is needed.

Measurements were performed using an Agilent 8900 ICP-QQQ (model #100, Advanced Applications configuration). The instrument was fitted with the standard glass concentric nebulizer, quartz spray chamber, quartz torch with 2.5 mm injector, and nickel sampling and skimmer cones. The instrument model used includes an inert, low contamination argon gas flow path, which reduces levels of sulfur (and silicon) in the gas supplied to the plasma torch. The effectiveness of this inert gas flow path is illustrated by the low ng/L (ppt) detection limit that can be achieved for sulfur in high purity semiconductor reagents (16). Samples were introduced via a peristaltic pump with 1.02 mm i.d. pump tubing. Operating conditions are shown in Table III.

Sulfur standards and matrix element solutions were prepared from single element stock standards (Agilent Technologies). Sulfur isotope standards were prepared from sulfur isotope CRMs IAEA-S-1, S-2, and S-3 (National Institute of Standards and Technology [NIST]). Ultrapure water was prepared in the laboratory using a Milli-Q Element system, and acids used for sample stabilization and matrix preparation were Ultra pure Normatom grade (VWR Chemicals).

Comparing MS/MS and Single Quad Mode for Analysis of Sas SO+

The mass-shift approach to resolve interferences has been described extensively (17). To assess the ability of MS/MS to resolve matrix interferences on the sulfur isotopes, mass spectra were acquired covering the region where the S16O+ product ions would appear (

). The same acquisition was performed in MS/MS mode and “single quad” mode, where Q1 is operated as a simple ion guide (no mass filtering). A 10 μg/L (ppb) S standard and separate solutions containing potentially interfering matrix elements Ca, Ti, and C were measured. The overlaid spectra (sulfur standard and matrix solutions) are shown for both modes in Figure 1.

The good isotope template fit and freedom from matrix overlaps for sulfur in MS/MS mode contrasts markedly with the severe overlaps apparent in “single quad” mode. The difference is due to the inability of the single quadrupole to reject the existing Ca

 product ions are measured. In MS/MS, these interfering ions are all rejected by Q1, which is set to pass only the mass of the respective precursor S

Controlling Product Ion Formation with Q1 in MS/MS Mode

With O-atom addition reactions, the large (16 u) mass difference between the precursor and product ion masses means any existing ions at the product ion masses can be rejected, even if Q1 is operated in bandpass mode (mass window > 1 u). However, existing ion overlaps are not the only potential interferences that can affect the accurate measurement of S as SO+. If the sample contains phosphorus (P), 

 48. This is illustrated in Figure 2, where a scan of a sulfur standard (25 μg/L) is shown overlaid with scans of 0.5% H

 and 0.5% HCl. The solutions were measured in MS/MS mode and with Q1 set to pass a 3 u mass window (simulating bandpass operation). In bandpass mode, the P matrix gives rise to an intense interference at 

 32, while MS/MS ensures effective resolution of the 

S+ requires Q1 to operate as a 1 u mass filter (MS/MS mode).

Sulfur Isotope Analysis in Natural Waters

The relative abundance of the stable (non-radiogenic) sulfur isotopes varies a lot in natural materials due to fractionation during redox reactions. The variation in abundances is calculated as a deviation (or delta, δ) in the abundance of the minor isotope (such as δ

S), expressed in per mil (parts per thousand, ‰). Natural materials such as groundwaters, soil, vegetation, and rocks can contain sulfur isotopes with δ

S values ranging from -40‰ to +40‰, and occasionally more (18). This variation enables researchers to study processes such as sedimentary rock formation and biogeochemical cycles. High precision sulfur isotope analysis is usually performed using an isotope ratio mass spectrometer (IRMS), such as a thermal ionization mass spectrometer (TIMS), secondary ionization mass spectrometer (SIMS), or multi-collector ICP-MS. However, the large variation in natural sulfur isotope abundances means that an ICP-MS/MS method with O

 cell gas can measure the differences in S ratios, albeit less precisely.

Determining accurate S isotope abundances by conventional ICP-MS can be affected by errors from interisotope overlaps. Where the mass that enters the CRC is not tightly controlled, multiple sulfur isotopes can react to form product ion overlaps. For example, 

 is excluded from the CRC. As with adjacent mass overlaps (such as 

), resolving inter-isotope overlaps requires Q1 to operate as a 1 u mass filter (MS/MS).

Sulfur isotopes were measured in a range of mineral water, river water, spring water, and seawater samples, using ICP-MS/MS in mass-shift mode with O

 cell gas. Sulfur isotope calibration was based on IAEA-S-1, and bracketing standards were used for mass bias correction. The results are summarized in Figure 3. Excellent δ

 = 10) was obtained. The accuracy of the method was confirmed by the measured δ

S value for NASS 5 seawater (21.5‰), which agreed well with the global average value for oceanic seawater of 21‰ (18).

Sulfur isotope analysis in geochemistry applications may require the measurement of the 

 using ICP-MS, but the large difference in abundance between 

S isotopes can cause errors in the analysis of the minor isotope. In ICP-MS/MS analysis using O

S is measured. This separation can be degraded either by poor Q1 resolution (mass window >1 u), or by poor abundance sensitivity (peak tail of 

S peak would contribute to the signal at the adjacent mass 33, affecting the 

This potential error was assessed by measuring digested sulfide minerals and calculating the mass-independent deviation in the measured abundance of the 

S). Mass independent fractionation of sulfur isotopes rarely occurs naturally, so the defect in 

S x 0.515 should equal zero, assuming equilibrium fractionation (19). A measured value of zero (within experimental error) therefore indicates no contribution from 

S. The results obtained with ICP-MS/MS are shown in Table IV, with a δ

S of -0.1 confirming no contribution from 

product ion masses provides the opportunity to determine sulfur accurately at lower levels than was previously possible by ICP-MS. By allowing only the target S

precursor ion into the CRC, MS/MS eliminates potential interferences from other reactive ions (such as 

) and from existing ions at the product ion masses (such as 

MS/MS also excludes the possibility of inter-isotope overlaps, enabling accurate sulfur isotope analysis in complex sample matrices. These measurements cannot be performed successfully using conventional single quadrupole or bandpass ICP-MS.

B. Bouyssiere, P. Leonhard, D. Profrock, F. Baco, C. L. Garcia, S. Wilbur, and A. Prange, 

J. Heilmann, S.F. Boulyga, and K.G. Heumann, 

J.G. Martinez-Sierra, F.M. Sanz, P.H. Espilez, R. Santamaria-Fernandez, J.M.M. Gayon, and J.I.G. Alonso, 

C.J. Smith, I.D. Wilson, L. Weidolf, F. Abou-Shakra, and M. Thomsen, 

P.J. Turner, T. Merren, J. Speakman, and C. Haines, G. Holland, and S.D. Tanner (eds), 

Plasma Source Mass Spectrometry: Development and Applications

. (The Royal Society of Chemistry, Cambridge, United Kingdom, 28–34,1997).

D. Pröfrock, P. Leonhard, and A. Prange, 

D.R. Bandura, V.I. Baranov, and S.D. Tanner, 

K. De Wolf, L. Balcaen, E. Van De Walle, F. Cuyckens, and F. Vanhaecke,

S.D. Fernandez, N. Sugishama, J.R. Encinar, and A. Sanz-Medel. 

L. Balcaen, G. Woods, M. Resano, and F. Vanhaecke, 

K. Nakano, Ultra-low-level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ (Agilent application note 5991-6852EN, 2016).

L. Balcaen, E. Bolea-Fernandez, M. Resano, and F. Vanhaecke, 

T.B. Coplen, J.K. Böhlke, P. De Bièvre, T. Ding, N.E. Holden, J.A. Hopple, H. R. Krouse, A. Lamberty, H. S. Peiser, K. Revesz, S.E. Rieder, K.J.R. Rosman, E. Roth, P.D.P. Taylor, R.D. Vocke Jr., and Y.K. Xiao, 

are withAgilent Technologies LDA (UK) Ltd, in the United Kingdom. 

is with Agilent Technologies International in Japan. Direct correspondence to: 

Articles

Combined with appropriate selection of instrument components to reduce the sulfur background, ICP-MS using MS/MS with oxygen reaction cell gas can provide accurate low-level analysis of sulfur and sulfur isotope ratios in aqueous and organic matrices. This is useful in applications in life science, clinical research, pharmaceutical development, food safety, environmental monitoring, geochemistry, and petrochemistry.

Accurate, Low-Level Sulfur Analysis by ICP-MS Using MS/MS with Oxygen Reaction Cell Gas

Collision–reaction cell methods are now almost universally accepted in quadrupole inductively coupled plasma–mass spectrometry (ICP-MS) applications. Helium collision mode provides dramatic improvements in detection limits and accuracy of quantitation for many elements by reducing the relative transmission of polyatomic ions compared to the monatomic analyte ions that they overlap. However, spectral interferences that are not caused by polyatomic ions cannot be controlled effectively using helium collision mode. One important example is isobaric overlaps, where isotopes of two different elements occur at the same mass. Reactive cell gases can provide a solution to isobaric overlaps if a gas is selected that reacts quickly with one of the isobaric elements and slowly, or not at all, with the other. This approach, termed "chemical resolution," allows the target isotope to be resolved from the overlapping isobar. To control the reaction chemistry and to ensure that only the intended product ions are measured, an additional mass selection step (before the collision/reaction cell) is essential. This is achieved using a tandem mass spectrometry system (ICP-MS/MS), such as a triple-quadrupole configuration. In this work, we present application examples where ICP-MS/MS was used to separate isobaric overlaps, allowing accurate analysis to be performed.

	The development of collision–reaction cells in inductively coupled plasma–mass spectrometry (ICP-MS) around 20 years ago transformed the ability of analysts to address spectral interferences. In practical applications, the use of helium (He) collision cell gas and kinetic energy discrimination (KED) has been particularly effective to reduce polyatomic ion overlaps (1). Helium mode has improved the accuracy of ICP-MS results for many previously problematic analytes, such as the first-row transition elements, which suffer from multiple polyatomic overlaps in common sample types.

	However, while He mode may be viewed as a near universal approach to reducing polyatomic ion interferences in ICP-MS (2), it is not at all effective for certain other spectral overlaps. He mode cannot resolve the isobaric (same mass) interferences that occur when two (or more) different elements have an isotope at the same nominal mass (for example, 

 204). These isotopes are much too close to be mass-resolved using sector-field "high-resolution" ICP-MS. The resolution (

) required to separate the Hg/Pb isobars is almost 500,000, whereas sector-field ICP-MS instruments are limited to a resolution of about 10,000 (3). Direct interelement overlaps can also occur because of peak "tailing" from an adjacent mass; for example, boron analysis in organic solvents is affected by the low-mass tail from 

	All naturally occurring elements (except indium) have at least one isotope that is free from direct overlap from an isotope of another element, so isobaric overlaps should theoretically be avoidable. But the "free" isotope is not always the most abundant, and may be severely affected by other interferences, such as matrix-based polyatomic ions. Consequently, there may be analytical benefits to measuring an alternative isotope, even one that has an isobaric overlap, if a method can be devised to avoid or remove the overlapping isotope.

	Also, some applications require the measurement of more than one isotope, for example when isotope dilution is used for quantitative analysis, or where natural variations in isotopic abundances are studied. Isotopic dating (geochronology) studies require the analysis of two or more isotopes of an element to measure the degree of isotopic fractionation or radioactive decay over time. These applications require the accurate measurement of a second isotope, and such secondary isotopes often suffer overlap from isotopes of other elements.

Isobaric Overlaps on Natural and Radiogenic Isotopes

	Methods to address some isobaric overlaps are well-established, such as the use of cool plasma (4) or a reaction gas (5) to remove the interference from the major isotope of argon (

Ar, 99.6%) on the major isotope of calcium (

Ar allows the major Ca isotope to be measured, enabling trace level analysis of Ca in semiconductor process chemicals.

	Other isobaric overlaps are less well-known, but may impact ICP-MS performance for emerging applications. One example is the increasing need to monitor elements arising from high-technology industries and manufacturing. Elements including Ga, Ge, Nb, In, Te, and Ta may be important environmental contaminants, and their behavior and potential toxicological impact are not well understood (6). These elements can be measured using ICP-MS; indeed Ge, In, and Te are commonly used as internal standards. But some of these elements are difficult to measure at low levels and, because their natural background levels in the environment are extremely low, analytical methods must be carefully optimized.

	For example, Te detection limits are degraded by its relatively poor ionization. The first ionization potential of Te is 9.01 eV, similar to other poorly ionized elements, Be, Cd, and Zn, so Te is only about 25% ionized in a normal ICP. Also, the only Te isotope that is free from isobaric overlap is 

Te, so this is the preferred Te isotope for ICP-MS measurements. But 

Te has an isotopic abundance of only 7.07%, so the sensitivity is reduced by almost a factor of five compared to the most abundant Te isotope. To measure Te at low levels in environmental samples, it would be beneficial to be able to measure the more abundant isotopes, 

Te (34.08%). However, both these isotopes suffer isobaric overlaps from Xe (a common trace contaminant in high-purity argon gas), while 

Ba, which may be present at milligram-per-kilogram (part-per-million) levels in natural environmental samples. An ICP-MS/MS method that removes the Xe and Ba isobaric overlaps would significantly improve the trace determination of Te.

	Analysis of non-natural, radiogenic isotopes of interest in the nuclear industry can also be compromised by isobaric overlaps. These elements may need to be monitored following accidental release, or from decommissioning, waste disposal, or weapons testing activities. There is increasing interest in the potential of ICP-MS as a rapid technique for measuring radiogenic isotopes with long half-lives and therefore low specific activity (7). Radiogenic isotopes are frequently overlapped by isotopes of naturally occurring elements, which may be present at much higher concentration than the radiogenic isotope of interest. Examples include 

Eu) (11). Radiometric techniques are ideal for measuring the highly radioactive isotopes (such as 

Cs) that are monitored after an accidental release. But activity-based techniques are less suitable for the lower activity levels of the long-lived radioisotopes that persist in the environment long after the initial release. For these isotopes, the ability of ICP-MS/MS to resolve isobaric overlaps may offer a superior detection capability compared to traditional radiometric approaches.

	Theoretically, the reaction chemistry used to resolve isobaric interferences should be applicable to quadrupole ICP-MS instruments with a simple collision–reaction cell, or a bandpass filter before or in the cell. However, these configurations do not possess a true (1 u) mass filter upstream of the collision–reaction cell, so are unable to selectively pass only one precursor ion mass to the cell. As a result, the reaction chemistry is nonspecific, and the product ions formed are unpredictable, and vary with the sample composition. These errors are eliminated using MS/MS mode on a triple-quadrupole ICP-MS system.

	Isotopic overlaps from one element on another can also occur due to peak "tailing" from an adjacent mass. The efficiency with which a mass filter separates adjacent masses is called the abundance sensitivity (AS). This figure indicates the contribution that a peak makes to its neighbors, expressed as a ratio of the peak intensities.

	The mass spectrometer used in a typical quadrupole ICP-MS system operates with AS of about 10

 counts per second (cps) would contribute 1 cps to the masses 1 u above and below. If a trace analyte occurs next to an intense major element peak, accurate determination of the analyte can be difficult or impossible. Examples include the measurement of boron in organic solvents, and trace manganese analysis in an iron-rich matrix. The intense 

Mn peak, contributing to the background at 

 55 and affecting the accuracy of Mn results. In the nuclear industry, radiogenic isotopes that must be measured at extremely low levels can also be impacted by peak tailing, such as trace neptunium 237, measured next to the major isotope of U (238).

	Tandem mass spectrometry offers an interesting solution for these peak tailing overlaps, since the double mass selection of MS/MS improves the AS of the instrument. When both quadrupoles (before and after the cell) of a triple-quadrupole ICP-MS system are operated as true mass filters with a mass resolution of ~0.75 u (MS/MS mode), the overall AS of the instrument is the product of the AS of the two quadrupoles, so 10

. This dramatically improves the ability to separate a trace peak from an intense peak at an adjacent mass.

	An Agilent 8900 ICP-QQQ system (model 100, Advanced Applications Configuration) was used for all measurements. The instrument was fitted with a glass concentric nebulizer, quartz spray chamber, standard quartz torch with 2.5-mm injector, and standard nickel sampling and skimmer cones. Samples were introduced via the built-in peristaltic pump fitted with 1.02-mm i.d. pump tubing.

) was used to resolve the Xe and Ba overlaps on Te at 

 128 and 130. Helium was also added to the cell as a buffer gas. For 

) cell gas was used with mass-shift mode to resolve the isobaric interference from the 

U peak tail and the polyatomic overlaps from UHx that interfere with the trace determination of 

Np. The main operating conditions of the instrument are shown in Table I.


	Table I: ICP-MS/MS acquisition parameters used for measurement of Te in N

	Tellurium calibration standards and Ba matrix solutions were prepared from single-element stock solutions (Agilent Technologies). Ultrapure water was prepared in the laboratory using a Milli-Q Element system (Merck-Millipore), and nitric and hydrochloric acids used for sample stabilization were Ultrapure NORMATOM grade (VWR Chemicals).

	The U matrix for the Np determination was obtained from Agilent, and the trace 

Np standard was measured as part of an instrument evaluation by Springfields Fuels Ltd., UK (12).

 cell gases plus He buffer gas was used to resolve the isobaric interferences on the two most abundant isotopes of Te at 

 128 and 130. The improvement in trace detection of Te due to the removal of the Xe isobaric overlap is illustrated in the calibrations from 1 to 1000 ng/L (ppt) shown in Figure 1 (scales zoomed to ~200 ppt for clarity). The two major isotopes of Te, 

Te (right), are shown. The upper pair of calibration plots show the calibrations in no gas mode. The 

Xe contributing to the blank signal, giving background equivalent concentrations (BECs) of 16 ng/L for 

Te. The difference in the BECs is due to the ~2x higher abundance of 

 cell gas mode (lower pair of plots), the 

-axis offset is completely removed (background signals of 0.3 and 0.2 cps), leading to BECs of 0.029 ng/L and 0.017 ng/L for 

 mode reduced the BEC by a factor of more than 500 for 


	Figure 1: Zoom to show low level calibrations for 

Te (right) in no-gas mode (top) and MS/MS mode with N

	The mixed cell gas method allows the isobaric overlaps from both Xe and 

Te to be removed using the same cell conditions. This was tested using a series of Ba standards from 20 to 1000 µg/L (ppb). Each Ba standard was spiked with 500 ng/L Te, and measured in both no-gas mode and N

 cell gas mode. The measured Te concentrations are shown in the plot in Figure 2, and the recoveries are given in Table II. In no-gas mode, the lowest Ba concentration (20 ppb) gave around 50% error in the Te recovery. In 1000 ppb Ba, the 

Ba contribution led to a reported Te concentration almost 30x higher (2909% recovery) than the true Te concentration. In N

 mode, the Te recoveries were within ± 3% for all Ba concentrations.


	Table II: Recovery of 500 ng/L (ppt) Te spike 

Te in variable Ba matrix levels using MS/MS mode with N

Np was measured in a uranium matrix using MS/MS mass-shift mode with O

 cell gas. Mass shift refers to the mode of operation where Q1 (before the cell) is set to the precursor ion of interest (

Np in this case) and Q2 (after the cell) is set to the target product ion mass (NpO

 269 in this case). The mass transition for Np analysis is Np

 and less favorable for the potential polyatomic overlaps (

) that can affect ultratrace-level Np analysis when U is present. U

 ions are rejected by Q1. The abundance sensitivity of Q1 (10

 in the cell, the potentially interfering product ion 

 270) then undergoes a further mass filtering step in Q2. This reduces the contribution from 

Np is measured completely free from U overlap. This is illustrated in the spectrum in Figure 3, which shows overlaid 

Np standards from 0.19 to 9.5 ng/L (ppt), each prepared in a matrix of 10 mg/L (ppm) U. The calibration presented in Figure 4 shows that the BEC for 

Np in the 10 ppm U matrix was 0.32 pg/L (ppq), demonstrating the ability of triple-quadrupole ICP-MS to separate adjacent mass overlaps by utilizing the improved abundance sensitivity of MS/MS.


	Figure 2: Recovery of 500-ng/L (ppt) Te spike measured at 

Te in varying Ba matrix levels, in MS/MS mode with N

	Double mass selection (MS/MS) in a triple-quadrupole ICP-MS system has been applied to resolving direct, isobaric overlaps and peak tailing contributions from adjacent peaks. Isobaric overlaps can be chemically resolved using controlled, selective reaction chemistry in the collision–reaction cell of the ICP-MS/MS system. This approach allows normally inaccessible isotopes to be measured, providing improved analytical performance and enabling isotope ratio and isotope dilution measurements.

Np standards at 0, 0.19, 0.95, 1.9, and 9.5 ng/L (ppt) in U matrix of 10 mg/L (ppm), showing baseline separation of 

	The improved abundance sensitivity of MS/MS mode also offers analysts the possibility to measure trace elements using isotopes that would otherwise be affected by peak tailing from an adjacent major element. This approach is illustrated using the example of ultratrace 

Np in 10 ppm U matrix, showing BEC of 0.32 pg/L (ppq) and DL of 0.56 pg/L in MS/MS mass-shift mode with O

	(1) N. Yamada, J. Takahashi, and K. Sakata, 

	(3) N. Jakubowski, T. Prohaska, L. Rottmann, and F. Vanhaecke, 

	(5) S.D. Tanner, V.I. Baranov, and U. Vollkopf, 

	(6) M. Filiella and I. Rodushkin, 2018, 

	(7) I.W. Croudace, B.C. Russell, and P.W. Warwick, 

	(8) P. Petrov, B. Russell, D.N. Douglas, and H. Goenaga-Infante, 

	(10) G. Yang, Y. Kato, H. Tazoe, and M. Yamada, 

	(11) M. G. Miranda, B. Russell, and P. Ivanov, 

	(12) G. Duckworth and G. Woods, "Accurate Analysis of Neptunium 237 in a Uranium Matrix, Using ICP-QQQ with MS/MS," 2017, Agilent publication 5991-6905EN.

 are with Agilent Technologies LDA (UK) Ltd. Direct correspondence to: 

When using a triple-quadrupole ICP-MS system, the increased abundance sensitivity of MS/MS mode makes it possible to measure trace elements using isotopes that would otherwise be affected by peak tailing from an adjacent major element. This approach is illustrated using the example of ultratrace 237Np analysis in the presence of 10 ppm U.

Using Double Mass Selection and Reaction Cell Gases to Resolve Isobaric Spectral Overlaps in ICP-MS

	This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue 

Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists

		E. McCurdy, M. Yamanaka, and S. Wilbur, 

This table is supplementary information to the article "Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS," which was published in the September 2017 supplement issue "Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists" to Spectroscopy. 

Ed McCurdy

Articles

Accurate, Low-Level Sulfur Analysis by ICP-MS Using MS/MS with Oxygen Reaction Cell Gas

Using Double Mass Selection and Reaction Cell Gases to Resolve Isobaric Spectral Overlaps in ICP-MS

Supplementary Information: Accurate Measurement of Ultrafine Silica Nanoparticles Using ICP-MS/MS