Surface Sensitive Photothermal AFM-IR Unlocks New Dimensions in Precision Analysis for Top Layer of Sample

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Bruker’s Surface Sensitive AFM-IR technology provides high-resolution surface sensitivity, reducing chemical probing depth to under 30 nanometers.

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Robert Ewing of the Pacific Northwest National Laboratory. | Photo Credit: Will Wetzel
Robert Ewing of the Pacific Northwest National Laboratory. | Photo Credit: Will Wetzel
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