Wednesday, April 6th 2022 at 2 pm EDT | 11 am PDT | 7 pm GMT New exciting results on TERS nanoscale spectroscopic characterization of 2D materials and their lateral and vertical heterostructures will be presented.
Register Free: https://www.spectroscopyonline.com/spec_w/TERS_TEPL
It would not be too much of exaggeration to state that Physics and Materials Science research of the first half of the 21-st century is being shaped by the amazing discoveries of 2D materials such as graphene, transition metal dichalcogenides (TMDs), black phosphorous and their heterostructures, both vertical and lateral. Raman spectroscopy and hyperspectral Raman imaging is extremely efficient for characterization of 2D materials. Quite often, the scale of structural or electronic or morphological heterogeneity in these materials, not to mention their heterostructures, is on the order of few tens of nanometers or less, which is beyond the spatial resolution of conventional Raman microscopy.
Tip enhanced Raman scattering (TERS) and tip enhanced photoluminescence (TEPL) can enhance the spatial resolution. In this lecture we’ll -
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AFM-Raman Product Manager
Andrey Krayev received his graduate degree from the Moscow Institute of Physics and Technology in 1991. In 2001 he started to use SPM while working as an application scientist for QPT Inc. Since 2008 he has been the CTO of AIST-NT Inc. He is actively involved in the development of the TERS technique and its implementation for advanced characterization of modern materials. Following the acquisition of AIST-NT technology by Horiba in 2017, Andrey holds the position of the North America AFM-Raman manager for Horiba Scientific. He continues active development of TERS-related applications for advanced characterization of 2D materials and beyond. Results of his collaborative research with leading groups in the US and worldwide are being published in high visibility journals like Nature, Nano Letters, and 2D Materials.