X-ray and AFM Study of Volcanic Ash Particles Produces Risk-Assessment Protocol
A paper published by a joint Icelandic and Danish team in the journal, Proceedings of the National Academy of Sciences (April 25, 2011), provides evidence that a move to ground European aircraft was justified after an April 14, 2010, volcanic event allowed meltwaters from the Eyjafjallaökull glacier to mix with hot magma from the volcanic site, sending fine ash into the jet stream.
A paper published by a joint Icelandicand Danish team in the journal,Proceedings of the National Academyof Sciences (April 25, 2011), providesevidence that a move to groundEuropean aircraft was justifiedafter an April 14, 2010, volcanicevent allowed meltwaters from theEyjafjallaökull glacier to mix withhot magma from the volcanic site,sending fine ash into the jet stream.The team used X-ray photoelectronspectroscopy and atomic forcemicroscopy to assess toxicity risk andto determine the composition of theindividual ash particles.
The study involved taking a uniqueset of dry ash samples collectedimmediately after the explosive eventand comparing the samples withfresh ash from a later, more typicaleruption. Using nanotechniquescustom-designed for studying naturalmaterials, the team explored thephysical and chemical nature of theash to determine if fears about healthand safety were justified. Additionally,they developed a protocol that willserve for assessing risks during afuture event.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
