Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.
Assia Shagaleeva
Advertisement
Articles by Assia Shagaleeva
Advertisement
Latest Updated Articles
- Characterization of SiO2 on Glass by Spectroscopic Ellipsometry
Published: May 14th 2015 | Updated:
Advertisement
Advertisement
Trending on Spectroscopy Online
1
Pittcon 2026 Preview: The James L. Waters Annual Symposium Explores Generative AI in Chemical Measurements
2
Inside the Laboratory: The Pergantis Laboratory at the University of Crete
3
Improving High-Resolution Mass Spectrometry Platforms
4
Mapping the Spectroscopy Research Landscape
5