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Experiencing Bottlenecks in Your Raw Material ID? Real-Time Protein Monitoring: The Power of UV-VIS and Raman Spectroscopy in Bioprocessing Spectroscopy Emerging Leader in Molecular Spectroscopy Award Presentation, Plenary Lecture, and Symposium ICP-OES as a Viable Alternative to ICP-MS for Trace Analysis Telling the Story of Art Using Mobile Raman Technology

Experiencing Bottlenecks in Your Raw Material ID? Real-Time Protein Monitoring: The Power of UV-VIS and Raman Spectroscopy in BioprocessingSpectroscopy Emerging Leader in Molecular Spectroscopy Award Presentation, Plenary Lecture, and SymposiumICP-OES as a Viable Alternative to ICP-MS for Trace AnalysisTelling the Story of Art Using Mobile Raman Technology

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Characterization of SiO2 on Glass by Spectroscopic Ellipsometry

May 14, 2015

Spectroscopy

Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.