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Maximize Returns and Limit Competition with Optimized Identification New Developments in Microwave Synthesis Monitoring using Raman Spectroscopy Li-ion Batteries: Sample Prep Guidelines for Elemental Analysis 2023 Review of Spectroscopic Instrumentation Infrared Spectroscopy of Polymers XII: Polyamarids and Slip Agents

Maximize Returns and Limit Competition with Optimized IdentificationNew Developments in Microwave Synthesis Monitoring using Raman SpectroscopyLi-ion Batteries: Sample Prep Guidelines for Elemental Analysis2023 Review of Spectroscopic InstrumentationInfrared Spectroscopy of Polymers XII: Polyamarids and Slip Agents

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Characterization of SiO2 on Glass by Spectroscopic Ellipsometry

May 14, 2015

Spectroscopy

Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.