Article

Spectroscopy

Characterization of SiO2 on Glass by Spectroscopic Ellipsometry

Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.

 

Newsletter

Get essential updates on the latest spectroscopy technologies, regulatory standards, and best practices—subscribe today to Spectroscopy.

Related Videos
Cincinnati, Ohio, USA | Image Credit: © SeanPavonePhoto - stock.adobe.com.