Measuring thickness and optical constants of transparent films on transparent substrates can be a challenge for spectroscopic ellipsometry. The sensitivity of the HORIBA UVISEL ellipsometer allows this challenging task to be easily performed.
Advanced Spectroscopy Unlocks Secrets of Disordered Materials
June 18th 2025Researchers in Brazil have developed new optical techniques—SLIM, IC-scan, and RICO-scan—to probe the complex nonlinear properties of scattering and disordered materials, expanding potential applications in photonics, biomedicine, and thermometry.