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Joerg Mueller

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Articles

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Combining Confocal Raman with Atomic force Microscopy for High-Resolution Material Analysis

Ute Schmidt;Joerg Mueller;Olaf Hollricher;Wolfram Ibach
June 2nd 2005

Confocal Raman microscopy can be useful when applied to all samples that are heterogeneous on the micrometer to millimeter scale and that generally can be investigated by Raman spectroscopy. This article presents examples of confocal Raman microscopy from various fields of application including pharmaceutical analysis and stress measurements in semiconductors.

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