Research evaulating the performance of modern micro-X-ray fluorescence (μ-XRF) silicon drift detector (SDD) systems for forensic discrimination of electrical tape evidence, comparing results from eight participating laboratories addressed the critical need for standardized analytical protocols in forensic laboratories analyzing pressure-sensitive adhesive tapes, which are frequently encountered in criminal investigations including drug trafficking, kidnapping, and improvised explosive device construction. Spectroscopy spoke to Lacey Leatherland, lead author of the paper resulting from the study.