Author | Thomas Dieing

Articles

Key Elements of Confocal Raman Microscopy for High-Resolution Imaging

June 01, 2014

Special Issues

Article

The sensitivity of a high-resolution Raman imaging system is crucial to the quality of the acquired information.

Automated Confocal Raman and Atomic Force Microscopy Imaging of Nanostructured Materials and Devices

June 01, 2008

Special Issues

Article

The combination of confocal Raman and atomic force microscopes allows chemical and surface topography imaging of large samples without any ongoing process control by an operator. This article describes the relevant measurement principles and presents examples of automated measurements on nanostructured materials.