Raman Analysis of Si Crystallinity
September 01, 2011
While crystalline silicon (c-Si) is still the material of choice for modern solar cell manufacturing, the drive toward lower cost, more efficient solar cells is prompting a renewed interest in thin-film amorphous silicon (a-Si). In light of this, it is more important than ever to have the ability to quickly identify Si crystallinity, both qualitatively and quantitatively. In this application note, we evaluate how a portable Raman spectrometer can be used in conjunction with a portable video microscope to measure crystallinity.