Author | WITec Instruments Corp.

Articles

Topographic Confocal Raman Imaging using True Surface Microscopy

September 01, 2011

Application Notebook

Article

True surface microscopy for topographic confocal Raman imaging adds optical profilometer functionality to a highly sensitive confocal Raman microscope. Using this profilometer function, topographic scans of several square millimeters can be acquired, similar to a very large AFM topography image. This acquired large-area topography image can be used to trace the surface contours while acquiring a confocal Raman image.