Special Issues
August 01, 2009
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Infrared spectroscopy is a powerful analysis technique used in the semiconductor industry to ensure the quality of silicon and silicon wafers. The authors discuss the use of an inexpensive, lab-based system to measure carbon and oxygen concentrations in silicon to the level of precision required by the solar silicon industry.
August 01, 2009
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The authors illustrate the value of FT-IR–ATR with sample viewing through the analysis of an ink source on paper.
August 01, 2009
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The authors discuss the use of vibrational spectroscopy to differentiate an authentic article from a counterfeit one throughout a product's lifecycle, from component receipt at the site of manufacture, to product receipt by the end user.
August 01, 2009
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Whether used for traditional applications such as identifying counterfeit pharmaceuticals or in some of the more glamorous "CSI-type" forensic applications such as ink analysis, FT-IR technology continues to occupy a large and important space in the field of spectroscopy.
August 01, 2009
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The authors discuss the combined use of Raman and FT-IR spectroscopy in fields such as forensic science, biomedical science, catalysis, and polymers.
August 01, 2009
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Transmission methods are often affected by film thickness and can result in inaccuracies. Polarization measurement using attenuated total reflectance (ATR), a Fourier transform–infrared (FT-IR) technique, is offered as an alternate resource because it is not adversely affected by film thickness.
August 01, 2009
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The authors look at the ways in which an imaging FT-IR microscope system with an integrated linear array detector can aid in the examination of a wide array of samples.
August 01, 2009
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Spectroscopy presents a comprehensive index of our FT-IR articles since 2004.
August 01, 2009
Issue PDF
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Click the title above to open the Spectroscopy August 2009 regular issue, Vol 24 No 8, in an interactive PDF format.