Analysis of Solar Silicon Using High-Throughput Spectroscopy
August 1st 2009Infrared spectroscopy is a powerful analysis technique used in the semiconductor industry to ensure the quality of silicon and silicon wafers. The authors discuss the use of an inexpensive, lab-based system to measure carbon and oxygen concentrations in silicon to the level of precision required by the solar silicon industry.
Detection and Sourcing of Counterfeit Pharmaceutical Products and Consumer Goods
August 1st 2009The authors discuss the use of vibrational spectroscopy to differentiate an authentic article from a counterfeit one throughout a product's lifecycle, from component receipt at the site of manufacture, to product receipt by the end user.
Polarization Measurement of Film Using Single-Reflection FT-IR–ATR
August 1st 2009Transmission methods are often affected by film thickness and can result in inaccuracies. Polarization measurement using attenuated total reflectance (ATR), a Fourier transform–infrared (FT-IR) technique, is offered as an alternate resource because it is not adversely affected by film thickness.