Special Issues-08-01-2009

August 01, 2009

Infrared spectroscopy is a powerful analysis technique used in the semiconductor industry to ensure the quality of silicon and silicon wafers. The authors discuss the use of an inexpensive, lab-based system to measure carbon and oxygen concentrations in silicon to the level of precision required by the solar silicon industry.

August 01, 2009

The authors illustrate the value of FT-IR–ATR with sample viewing through the analysis of an ink source on paper.

August 01, 2009

The authors discuss the use of vibrational spectroscopy to differentiate an authentic article from a counterfeit one throughout a product's lifecycle, from component receipt at the site of manufacture, to product receipt by the end user.

August 01, 2009

Whether used for traditional applications such as identifying counterfeit pharmaceuticals or in some of the more glamorous "CSI-type" forensic applications such as ink analysis, FT-IR technology continues to occupy a large and important space in the field of spectroscopy.

August 01, 2009

The authors discuss the combined use of Raman and FT-IR spectroscopy in fields such as forensic science, biomedical science, catalysis, and polymers.

August 01, 2009

Transmission methods are often affected by film thickness and can result in inaccuracies. Polarization measurement using attenuated total reflectance (ATR), a Fourier transform–infrared (FT-IR) technique, is offered as an alternate resource because it is not adversely affected by film thickness.

August 01, 2009

The authors look at the ways in which an imaging FT-IR microscope system with an integrated linear array detector can aid in the examination of a wide array of samples.

August 01, 2009

Spectroscopy presents a comprehensive index of our FT-IR articles since 2004.

August 01, 2009

Click the title above to open the Spectroscopy August 2009 regular issue, Vol 24 No 8, in an interactive PDF format.