- Special Issues-08-01-2009
- Volume 0
- Issue 0
Letter from the Editor
Whether used for traditional applications such as identifying counterfeit pharmaceuticals or in some of the more glamorous "CSI-type" forensic applications such as ink analysis, FT-IR technology continues to occupy a large and important space in the field of spectroscopy.
Whether used for traditional applications such as identifying counterfeit pharmaceuticals or in some of the more glamorous "CSI-type" forensic applications such as ink analysis, FT-IR technology continues to occupy a large and important space in the field of spectroscopy. And the fact that many are of the opinion that FT-IR may be nearing maturity can only bode well for its future, as the history of other mature technologies such as gas chromatography attests — being an industry standard for decades to come is good for business, to say the least.
David Walsh
Here in this supplement, Spectroscopy has assembled a collection of some of the newest and most cutting-edge applications of FT-IR spectroscopy in the field today, from thought leaders across the industry. In addition to the applications mentioned above, readers will find research on FT-IR used in the semiconductor industry, FT-IR for polymer research, and more.
In an uncertain marketplace, reliable and established techniques and instrumentation will always thrive, and FT-IR certainly fits this definition. And with application in massive markets such as the pharmaceutical industry and emerging, cutting-edge markets such as forensics, the future is even brighter. Readers can look for more on FT-IR in the September edition of Spectroscopy's e-newsletter, "The Wavelength," as that month's issue is dedicated to this technique. And as always, look for more FT-IR research in the pages of Spectroscopy in the coming months.
Enjoy the issue.
David Walsh
Editor-in-Chief
Articles in this issue
over 16 years ago
Analysis of Solar Silicon Using High-Throughput Spectroscopyover 16 years ago
Rapid Analysis of Inks on Paper by Viewing FT-IR–ATR Spectroscopyover 16 years ago
Polarization Measurement of Film Using Single-Reflection FT-IR–ATRover 16 years ago
Advanced Infrared Imaging for Sample Analysisover 16 years ago
Index of FT-IR Articles in Spectroscopy: 2004–2009over 16 years ago
Vol 24 No 8 Spectroscopy August 2009 Regular Issue PDFNewsletter
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