January 01, 2004

A new quadupole ICP-MS instrument has been designed to improve the sensitivity of this elemental analysis technique.

The author discusses how the physical realm of the atmospheric ionization source -- materials, gas, and heat dynamics -- and manipulating the ionization modes themselves perhaps are the current forefront of technological innovation.

This second installment in the pair looks at NIR applications performed at-line and on-line, as well as some points to be considered in implementing NIR as a process analytical tool.

The authors discuss how the dynamics associated with laser ablation solid sampling systems ensures greater analytical precision and accuracy for ICP-MS/OES trace element analysis.

The fourth installment in the continuing series concentrates on issues that are amenable to mathematical analysis.