Spectroscopy-07-01-2012

X-ray photoelectron spectroscopy (XPS) can be used to determine the contaminants present on laboratory gloves and to evaluate the type and amount of contamination transfer from gloves to other surfaces.

As with other molecular spectroscopy techniques, demand for microscopy-enabled UV–vis–near infrared (NIR) spectroscopy is a developing segment of the market. Demand from the semiconductor and electronics industry is the primary driver, although there is considerable potential for other applications as well. So far none of the major UV–vis–NIR vendors compete in this niche market, but that could soon change.

How to reduce plasma-, matrix-, and solvent-induced polyatomic interference by bleeding a collision–reaction gas into the tip of the interface skimmer cone

Here's a glimpse of what to expect at this year's Denver X-ray Conference.

A report on first results of the successful application of optically pumped semiconductor lasers in Raman spectroscopy of condensed-phase samples

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A discussion of ion behavior, reaction, and logical patterns under various conditions

Click the title above to open the Spectroscopy July 2012 regular issue, Vol 27 No 7, in an interactive PDF format.