Spectroscopy-07-01-2012

July 01, 2012

X-ray photoelectron spectroscopy (XPS) can be used to determine the contaminants present on laboratory gloves and to evaluate the type and amount of contamination transfer from gloves to other surfaces.

July 01, 2012

As with other molecular spectroscopy techniques, demand for microscopy-enabled UV–vis–near infrared (NIR) spectroscopy is a developing segment of the market. Demand from the semiconductor and electronics industry is the primary driver, although there is considerable potential for other applications as well. So far none of the major UV–vis–NIR vendors compete in this niche market, but that could soon change.

July 01, 2012

How to reduce plasma-, matrix-, and solvent-induced polyatomic interference by bleeding a collision–reaction gas into the tip of the interface skimmer cone

July 01, 2012

Here's a glimpse of what to expect at this year's Denver X-ray Conference.

July 01, 2012

A report on first results of the successful application of optically pumped semiconductor lasers in Raman spectroscopy of condensed-phase samples

July 01, 2012

Product Resources

July 01, 2012

A discussion of ion behavior, reaction, and logical patterns under various conditions

July 01, 2012

Click the title above to open the Spectroscopy July 2012 regular issue, Vol 27 No 7, in an interactive PDF format.