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Spectroscopy-10-01-2002
Spectroscopy
A Beginner?s Guide to ICP-MS: Part XII ? A Review of Interferences (PDF)
October 01, 2002
Columns
Part 12 of the continuing series.
Radio Frequency Glow Discharge Optical Emission Spectroscopy: Depth Profiling Analysis of Thin Anodic Alumina Films as Potential Reference Materials (PDF)
October 01, 2002
Articles
The need for reference materials that can be applied in the area of thin films analysis has long been realized but is still, in general, under-addressed. Alumina films of single-micrometer thickness, having either fine distributions of impurities or delta function impurity marker layers, can be prepared routinely by anodic oxidation of electropolished aluminum specimens in appropriate electrolytes. Selected films were examined by transmission electron microscopy (TEM) and analyzed by radio frequency glow discharge optical emission spectroscopy (rf-GD-OES), providing very rapid, yet high-resolution, depth-resolved analysis of these electrically insulating materials.
Chemometrics in Spectroscopy: Analysis of Noise, Part XII (PDF)
October 01, 2002
Columns
Part 12 of the ongoing series.
Mass Spectrometry Forum: Chemical Noise in Mass Spectrometry ? Part I (PDF)
October 01, 2002
Columns
The column begins a new, mulipart series.