2D Materials Characterization Using Nanoscale
February 10, 2021
This application note describes using complementary s-SNOM and AFM-IR techniques to characterize 2D materials, such as graphene, nanoantennae, and semiconductor materials.
This application note describes using complementary s-SNOM and AFM-IR techniques to characterize 2D materials, such as graphene, nanoantennae, and semiconductor materials.