|Articles|February 10, 2021
2D Materials Characterization Using Nanoscale
Author(s)Bruker
This application note describes using complementary s-SNOM and AFM-IR techniques to characterize 2D materials, such as graphene, nanoantennae, and semiconductor materials.
Trending on Spectroscopy Online
1
Peter R. Griffiths (1942–2026): A Life Devoted to Infrared and Vibrational Spectroscopy
2
A History of The James L. Waters Symposium: Innovators, Instrumentation, and Applications, 1989-2026
3
Small Chips, Deep Signals: The Quiet Reinvention of Raman Instrumentation
4
Navigating High-Stakes and High-Visibility Projects
5