Agilent Technologies Inc. (Santa Clara, California) has agreed to support research by Steven Gross, a faculty member in the Department of Pharmacology at Weill Cornell Medical College (New York, New York), into amyotrophic lateral sclerosis (ALS), also known as Lou Gehrig’s disease.
Agilent Technologies Inc. (Santa Clara, California) has agreed to support research by Steven Gross, a faculty member in the Department of Pharmacology at Weill Cornell Medical College (New York, New York), into amyotrophic lateral sclerosis (ALS), also known as Lou Gehrig’s disease. Agilent will provide the latest mass spectrometry technology to support this research, which aims to achieve an understanding of how the most common form of this disease develops in the body.
Gross is an internationally recognized expert in the use of mass spectrometry-based metabolomics. His expertise is in pharmacology and cell biology, particularly in relation to the role of nitric oxide as a signaling molecule. Through the partnership, Agilent will provide two mass spectrometers for Gross’s laboratory.
Sporadic amyotrophic lateral sclerosis (sALS) accounts for about 90 percent of all ALS cases and has no obvious genetic driver. Gross and his collaborators-Giovanni Manfredi, a professor of neuroscience in the Feil Family Brain and Mind Research Institute at Weill Cornell, and Lorenz Studer, director of Sloan Kettering Institute’s Center for Stem Cell Biology-are investigating the molecular underpinnings of this form of ALS. The Agilent tools will assist the investigators in applying a multi-disciplinary-based approach to understanding the roots of this disease. Specifically, accurate-mass spectrometry will enable the researchers to test the hypothesis that fibroblasts express systemic metabolic markers that inform ALS.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.