ICDD Ludo Frevel Crystallography Scholarship Recipients Announced
The International Centre for Diffraction Data has selected the recipients for the Ludo Frevel Crystallography Scholarship.
The International Centre for Diffraction Data has selected the recipients for the Ludo Frevel Crystallography Scholarship.
For 2017, ten scholarships were awarded to students pursuing research topics such as real-time monitoring of solid-state reactions using X-ray powder diffraction and the study of battery materials through operando X-ray analysis. The ICDD will present each of these students with a check in the amount of $2,500 to assist in the continuation of studies in their selected fields of crystallographic research.
These scholarships are named for Ludo K. Frevel (1910-2011). Frevel joined the Dow Chemical Company spectroscopy laboratory in 1936 and was a top scientist there until his retirement. He held 60 patents and co-authored 446 technical papers, publishing his most recent paper at age 95. He was co-author with Hanawalt and Rinn on the 1938 paper, “Chemical Analysis by X-ray Diffraction.” He also wrote some of the first computer automated material identification software using X-ray powder diffraction data.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
