Innovations in Synchrotron Technology
The Canadian government is investing $3.8 million in the construction of two new research facilities that will focus on innovation in the field of synchrotron technology.
The Canadian government is investing $3.8 million in the construction of two new research facilities that will focus on innovation in the field of synchrotron technology. The facilities are being built for Canadian Light Source (CLS), which is Canada’s national center for synchrotron research.
Scientists can use synchrotron light to probe the structure of matter with greater accuracy and precision. X-ray absorption spectroscopy (XAS) is among the most powerful and versatile of synchrotron techniques. XAS probes the molecular and electronic structure of a specific element and can be applied without pre-treatment of the sample.
The University of Saskatchewan’s BioXAS Beamline Facility will be tailored for life science studies of metals in living systems using X-ray absorption spectroscopy and imaging.
The University of British Columbia’s Quantum Materials Spectroscopy Centre is a state-of-the-art beamline dedicated to performing spin and angle-resolved photoemission spectroscopy.
Located on the University of Saskatchewan campus in Saskatoon, the CLS conducts research in the natural sciences, natural resources and energy, health and life sciences, and information and communications technology.
AI and Satellite Spectroscopy Team Up to Monitor Urban River Pollution in China
April 30th 2025A study from Chinese researchers demonstrates how combining satellite imagery, land use data, and machine learning can improve pollution monitoring in fast-changing urban rivers. The study focuses on non-optically active pollutants in the Weihe River Basin and showcases promising results for remote, data-driven water quality assessments.
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.
