ICDD is a non-profit scientific organization dedicated to collecting, editing, publishing, and distributing powder diffraction data for the identification of crystalline materials. Our mission is to continue to be the world center for quality diffraction and related data to meet the needs of the technical community. We promote the application of materials characterization methods in science and technology by providing forums for the exchange of ideas and information. We sponsor the Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD), Denver X-ray Conference; its proceedings, Advances in X-ray Analysis and the journal, Powder Diffraction. ICDD and its members conduct workshops and clinics on materials characterization at our headquarters in Newtown Square, Pennsylvania, and at X-ray analysis conferences around the world.
PDF-4+ is our most advanced database, providing comprehensive material coverage for inorganic materials. It includes atomic coordinates and embedded structure factors as well as full digital patterns to enable both phase identification and quantitative analysis. PDF-4 products also include experimental digital patterns of noncrystalline materials, such as most clays and industrially important polymers. In addition, PDF-4+ offers a suite of electron diffraction tools including electron diffraction powder pattern simulations, an interactive spot pattern simulation, and an electron diffraction backscatter pattern simulation module.
International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square, PA 19073
TELEPHONE
Toll Free US: (866) 378.9331
FAX
(610) 325-9823
E-MAILinfo@icdd.com
WEB SITEwww.icdd.com
YEAR FOUNDED
1941
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.