SPEC PerkinElmer 10.13
News|Webcasts|October 8, 2026

Micro-Contamination Analysis on Electronic Assemblies: Next-Generation Micro-FTIR Imaging with Spotlight Aurora-I

Author(s)PerkinElmer

Tue, Oct 27, 2026 9:00 AM EDT | 1:00 PM CET | 10:00 PM JST (1:00 PM UTC)

Locating micro-contamination on electronic assemblies can take hours of manual searching. Join PerkinElmer to see how next-generation micro-FTIR imaging finds targets in seconds and identifies unknown contaminants by IR spectroscopy.

Register Free: https://www.spectroscopyonline.com/spec_w/assemblies

Event Overview:

Contamination remains one of the most common and costly causes of failure in electronic assemblies yet locating the responsible particle or residue on a densely packed assembly can take hours of manual searching. Using a disassembled smartphone as a test case, this webinar shows how the Spotlight Aurora-I next generation micro-FTIR imaging system uses a wide-field camera to cut target-finding time from hours to second.

Point mode micro-ATR then identifies particles around 20 µm in size directly on the assembly, without picking up or transferring the particle, while reflectance imaging maps the distribution of contamination across multiple metal contacts. The same approach applies to automotive electronics, medical devices, aerospace avionics, and semiconductor packaging, giving failure analysis and QA teams a faster path toward root cause.

Key Learning Objectives

  • Cut target-finding time from hours to seconds with the dual camera system
  • Acquire high-quality, non-destructive spectra in point-mode micro-ATR
  • Analyze complex, multi-component contamination efficiently by IR imaging

Who Should Attend

  • Material Engineering / R&D departments at industrial and commercial organizations
  • Researchers at public (government) and private (higher education) research institutes

Yasuhiro Niida
Senior Product Specialist
PerkinElmer, Japan

Yasuhiro Niida is a Field Application Specialist at PerkinElmer Japan's Application Research Laboratory, leading IR and UV-Vis applications. His 20-year career centers on spectroscopic characterization of molecular orientation, interfaces, and thin films, beginning at Kobe University. He now works as a research collaborator on AMΦ, a national research project on airborne microplastics and their health impacts, funded by Japan's Environment Research and Technology Development Fund.

Register Free: https://www.spectroscopyonline.com/spec_w/assemblies