PerkinElmer

March 16, 2023

This study outlines the quantitation and characterization of element oxide nanoparticles (Al2O3, and CeO2) in nanoelectronics and semiconductors.

March 16, 2023

Semiconductor manufacturing requires failure analysis and QC processes. Learn how Thermal Analyses applications can lead to cost savings in R&D and QA/QC.

March 16, 2023

This work demonstrates that the NexION® 2000 ICP-MS meets the needs of analytical laboratories involved in the analysis of waters and soils.

March 16, 2023

This work demonstrates the ability of the NexION® SP-ICP-MS to detect iron-containing nanoparticles in organic solvents using Reaction mode.

March 16, 2023

This work presents the automated analysis of HNO3 using the NexION® 5000 ICP-MS working with the ESI prepFAST S ultraclean sample introduction system.

March 16, 2023

This work describes a method for the routine ultratrace-level quantification of nanoparticle impurities in TMAH using the NexION® 5000 Multi-Quadrupole ICP-MS.

March 16, 2023

This work shows the ability of the Avio® 560 Max ICP-OES to perform rapid analysis – 60 seconds sample to sample – of wastewater in accordance with EPA Method 200.7.

March 16, 2023

This work presents a method for the direct analysis of trace elements in seawater samples using the NexION 5000 ICP-MS.

March 16, 2023

This work demonstrates the ability of the NexION® 5000 ICP-MS to determine DLs and BECs of typical non-metal contaminants in sulfuric acid solutions.

March 16, 2023

This work demonstrates the ability of the NexION® ICP-MS to analyze 21 elements in soil over an extended period of time with outstanding accuracy and stability.