New Website for PIKE
PIKE Technologies (Madison, Wisconsin) debuted a new company website, www.piketech.com, in October.
PIKE Technologies (Madison, Wisconsin) debuted a new company website, www.piketech.com in October. The company, which manufacturers sampling accessories for Fourier transform infrared (FT-IR), near infrared, and ultraviolet-visible spectrometers, offers on its website a list of all PIKE products, information about spectroscopy theory and sampling techniques, multiple application notes, and other technology and industry-related details.
The PIKE home page provides an interactive infrared crystal properties chart and an FT-IR calculator for wavelength conversions, sample thickness, and average true range calculations. The website’s search function generates product information, and there is an online form available for order placement and quote requests.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
