Novel Instrumentation for and Applications of Raman Spectroscopy
Raman spectroscopy, which is used to study vibrational, rotational, and other low-frequency modes in a system, provides vibrational information specific to a molecule?s chemical bonds and symmetry. This session will discuss topics such as Raman microscopy for 3-D depth profiling, correcting undesired optical coupling in fiber-optic probes, using Raman spectroscopy for bacterial identification, and sunscreen analysis using UV resonance Raman spectroscopy.
Raman spectroscopy, which is used to study vibrational, rotational, and other low-frequency modes in a system, provides vibrational information specific to a molecule’s chemical bonds and symmetry. This session will discuss topics such as Raman microscopy for 3-D depth profiling, correcting undesired optical coupling in fiber-optic probes, using Raman spectroscopy for bacterial identification, and sunscreen analysis using UV resonance Raman spectroscopy.
The first presentation in the session will be given by Emily Smith of Iowa State University and US DOE, Ames Laboratory, and is titled “Variable Angle Total Internal Reflection Raman Microscopy.” Smith will discuss three-dimensional Raman spectroscopy depth profiling using an instrument based on a traditional optical microscope platform and modified with beam steering optics to vary the angle of incident light on a prism–sample interface.
The next talk, to be delivered by Kathryn A. Dooley of the Department of Chemistry at the University of Michigan, is titled “Detection and Correction of Coupling Errors in Optical Fiber Bundles for Collection of Raman Spectra” and will cover a novel method for correcting undesired optical coupling in fiber-optic probes caused by diffraction or monochromatic aberrations and by optical cross-talk among tightly packed fibers.
Janie Dubois of Malvern Instruments will present the next talk, “A Targeted Approach to Bacterial Identification: A Combined Measurement Using Raman Spectroscopy and Cellular Morpology.” This method uses high-throughput morphological classification to prescreen a sample using shape and size. The method reportedly produces a simultaneous physical and chemical classification model that is superior to either microscopy or Raman spectroscopy alone.
The fourth presentation in the session, “Elucidating Iron Cluster Composition in Zeolites Through Comparison of Loading Technique,” will be delivered by Dana Sauter of Northwestern University. The presentation will discuss the investigation of iron complexes formed within zeolite pores and the types of iron-oxygen complexes formed using various catalyst loading methods.
The penultimate presentation will be given by Sulayman Oladepo from the University of Alberta and is titled “UV Resonance Raman Spectroscopy as a Robust Spectroscopic Tool for Probing Sunscreen Formulations.” Oladepo will discuss the in-situ analysis of sunscreen formulations using UV resonance Raman spectroscopy without prior sample preparation.
The final presentation of this session will be delivered by Xiaoyun Chen of The Dow Chemical Company and is titled “Discovery and Characterization of Tetraalkylammonium Polybromides with Raman Spectroscopy.” Chen will discuss the collection of Raman spectra from the polybromides in solid, liquid, and solution form.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
