
At SciX, Kevin Wilkinson of the Universite de Montreal explains how faster data acquisition and new software have cut analysis time and how a particle’s chemical composition can link arsenic-bearing emissions back to a copper refinery’s processes.
Raman confocal spectroscopy is increasingly being applied for the analysis of embedded contaminants within materials. A non-contact, non-destructive analysis method, Raman spectroscopy requires very little sample preparation, has greater spatial resolution compared to FT-IR microscopy and the confocal analysis method allows visualization of materials within a clear sample matrix. This paper will investigate the analysis of an embedded contaminant within a polymer matrix on a glass substrate.





