Raman Analysis of Embedded Contaminants

March 18, 2015
Richard A. Larsen

Hiroshi Sugiyama

Ken-ichi Akao

Jasco, Inc.


Raman confocal spectroscopy is increasingly being applied for the analysis of embedded contaminants within materials. A non-contact, non-destructive analysis method, Raman spectroscopy requires very little sample preparation, has greater spatial resolution compared to FT-IR microscopy and the confocal analysis method allows visualization of materials within a clear sample matrix. This paper will investigate the analysis of an embedded contaminant within a polymer matrix on a glass substrate.