Nanobase, Inc.

XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.

XperRAM S offers well-suitable Raman measurement performance to analyze subtle structural changes which can greatly affect drug dissolution and efficacy.

Raman spectroscopy is an advantageous analysis technique to the pharmaceutical research industry for its easy operation and screening accuracy.