This is the first of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series will address three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization.
This is the first of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series will address three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization. This first podcast will focus on the use of single-particle ICP-MS (SP-ICP-MS), its advantages for analyzing nanoparticles in environmental matrices, and its ability to track nanoparticle dissolution and aggregation in bioavailability and bioaccumulation studies.
You can view the associated webcast at: http://www.spectroscopyonline.com/advantages
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.