Spectral Systems is the leader in precise infrared optical components, coatings, systems integration, and services from original concept through final production.
With over 32 years of experience we can ensure your optics are made to meet your specifications. Our facility is equipped with state of the art polishing, coating, and inspection equipment to ensure your optics are fabricated consistently and efficiently.
We have the most comprehensive capabilities to provide optical solutions for the entire infrared spectral range, from the vacuum UV to the far-IR, no one else can cover the infrared spectrum better than Spectral Systems. We routinely work with over 16 infrared materials and have a broad range of proprietary coating solutions to meet all your needs.
Headquartered in Hopewell Junction, New York, with other offices in Connecticut and Wisconsin.
Spectral Systems LLC
35 Corporate Park Drive
Hopewell Junction, NY 12533
TELEPHONE
(845) 896-2200
FAX
(845) 896-2203
E-MAILinfo@spectral-systems.com
WEB SITEwww.spectral-systems.com
NUMBER OF EMPLOYEES
50+
YEAR FOUNDED
1983
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.