In the second part of our interview with Brandon Boor of Purdue University, he discusses how his team controls experimental variables during cleaning experiments in order to obtain interpretable data.
|Articles|December 1, 2017
- Spectroscopy-12-01-2017
- Volume 32
- Issue 12
Amptek, Inc.
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Company Description
Amptek, Inc., is a recognized world leader in the design and manufacture of state-of-the-art X-ray and gamma ray detectors, preamplifiers, instrumentation, and components for portable instruments, laboratories, satellites, and analytical purposes. These products provide the user with high performance and high reliability together with small size and low power.
Chief Spectroscopic Techniques Supported
X-ray fluorescence (EDXRF), direct spectral measurements, EDS XRF, PIXE, and TXRF.
Markets Served
Amptek serves wherever X-ray detection is used; for example, hand-held and table-top XRF analyzers produced by OEMs; research facilities in universities, commercial enterprises and the military; nuclear medicine; space; museums; environmental monitoring; and geological analysis of soils and minerals.
Major Products/Services
Amptek recently brought silicon wafer manufacturing in-house and improved the process. The results are detectors with lower noise, lower leakage current, better charge collection, and uniformity from detector to detector.
The FAST SDD® represents Amptek's highest performance silicon drift detector (SDD), capable of count rates over 1,000,000 CPS (counts per second) while maintaining excellent resolution. The FAST SDD® is also available with our Patented C-Series (Si3N4) low energy windows for soft X-ray analysis.
Amptek has developed a 70 mm2 FAST SDD® Detector in a TO-8 package. This is the same package that is used with all Amptek detectors. This makes the 70 mm2 a drop-in replacement (same package, same pin-out, same voltages). Triple the count rate versus the 25 mm2 SDD with the same performance.
Also offering improved performance are Amptek's SDD and Si-PIN detectors.
Amptek detectors are offered in a wide range of configurations with their Preamplifiers and Digital Pulse Processors (DPP) for complete XRF portable solutions.
Applications
- X-Ray fluorescence
- Process control
- OEM instrumentation
- RoHS/WEEE compliance testing
- Nondestructive analysis with XRF
- Restricted metals detection
- Environmental monitoring
- Medical and nuclear electronics
- Heavy metals in plastics
- Lead detectors
- Toxic dump site monitoring
- Semiconductor processing
- Nuclear safeguards verification
- Plastic & metal separation
- Coal & mining operations
- Sulfur in oil and coal detection
- Smoke stack analysis
- Plating thickness
- Oil logging
- Electro-optical systems
- Research experiments & teaching
- Art and archaeology
- Jewelry analysis
- SEMs
Amptek, Inc.
14 DeAngelo Drive
Bedford, MA 01730
TELEPHONE
(781) 275-2242
FAX
(781) 275-3470
E-MAIL
WEB SITE
NUMBER OF EMPLOYEES
47
YEAR FOUNDED
1977
Articles in this issue
almost 9 years ago
The Humble Instrument Logbook?almost 9 years ago
Avantes, Inc.almost 9 years ago
Alluxa, Inc.almost 9 years ago
ABB Measurement & Analyticsalmost 9 years ago
EDAX, Inc.almost 9 years ago
Edinburgh Instrumentsalmost 9 years ago
Electro-Optics Technology, Inc.Advertisement
Related to this article
An upcoming interview with Ji-Xin Cheng, a Theodore Moustakas Distinguished Professor in Photonics and Optoelectronics at Boston University, will highlight his ongoing work in coherent Raman scattering microscopy.
The bulky bench-top NIR spectrometer is quietly being dismantled and rebuilt as a wafer-scale photonic chip, a self-calibrating algorithm, and a sensor small enough to ride in a shirt pocket. What once demanded a grating, a moving mirror, and a climate-controlled lab now fits inside a handheld module, a bioreactor probe, or a drone payload, and it increasingly figures out what it is looking at on its own.
In the first part of a multi-part Q&A, Brandon Boor, the Dr. Margery E. Hoffman Associate Professor in the Lyles School of Civil and Construction Engineering at Purdue University, describes the instrumentation and methodology behind measuring nanoparticle size distributions at the nanocluster scale (1–3 nm) and outlines the technical challenges of acquiring reliable, real-time data at these dimensions.
Reliability, dynamic measurements, artificial intelligence, and real-world applications are reshaping Raman spectroscopy – while Molecular Photonics points toward new translational frontiers.
In this “Tutorial Tuesday” clip, we explore one of the spectroscopic techniques that are used to characterize polycyclic aromatic hydrocarbons (PAHs).
An upcoming presentation will explore how we can better understand and control nanoparticle morphology is critical for tuning material performance.
Jurgen Popp, Thomas Mayerhofer, and colleagues at Leibniz IPHT and Friedrich Schiller University Jena introduce the Personalized Optical Digital Twin (PODT), a Photonics21 contribution to Europe's Virtual Human Twin ecosystem that connects molecular photonics—Raman blood analysis, coherent Raman tissue imaging, and multimodal endomicroscopy—with longitudinal physiology and clinical data. Drawing on the published multicenter INTELLIGENCE trials, the authors argue that technical feasibility and clinical utility must be evaluated separately as the field moves toward Europe's FP10 research agenda.
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