EDAX is a leading provider of innovative materials characterization systems encompassing energy dispersive spectrometry (EDS), wavelength dispersive spectrometry (WDS), electron backscatter diffraction (EBSD), and X-ray fluorescence (XRF). EDAX products include standalone tools for EDS, EBSD and WDS, and integrated tools for EDS/EBSD, EDS/WDS, and EDS/EBSD/WDS. The company offers several XRF and micro-XRF elemental analyzers for small and microspot X-ray analysis and mapping. The XLNCE X-ray metrology line provides in-line instrumentation for process control and yield management for coating applications. EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate. EDAX designs, manufactures, distributes, and services products for a broad range of industries, educational institutions, and research organizations.
EDAX instrumentation for elemental and structural analysis is found in a broad spectrum of industrial, academic, and government applications from the field or production line to the most advanced research and development laboratory. Typical markets served include semiconductor and microelectronics, academic and industrial R&D laboratories, RoHS/WEEE renewable energy, pharmaceuticals, mining, forensics, petrochemicals, metallurgy, and manufacturing operations.
EDAX headquarters is located in Mahwah, New Jersey, housing sales, engineering, technical support, and operations. EDAX is committed to providing the best possible support for our customers world-wide with sales, service, and applications support offices located in Japan, China, Singapore, The Netherlands, Germany, the United Kingdom, and the United States.
EDAX Inc.
91 McKee Drive
Mahwah, NJ 07430
TELEPHONE
(201) 529-4880
FAX
(201) 529-3156
E-MAILinfo.edax@ametek.com
WEB SITEwww.edax.com
YEAR FOUNDED
1962
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
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