EDAX is a leading provider of innovative materials characterization systems encompassing energy dispersive spectrometry (EDS), wavelength dispersive spectrometry (WDS), electron backscatter diffraction (EBSD), and X-ray fluorescence (XRF). EDAX products include standalone tools for EDS, EBSD and WDS, and integrated tools for EDS/EBSD, EDS/WDS, and EDS/EBSD/WDS. The company offers several XRF and micro-XRF elemental analyzers for small and microspot X-ray analysis and mapping. The XLNCE X-ray metrology line provides in-line instrumentation for process control and yield management for coating applications. EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate. EDAX designs, manufactures, distributes, and services products for a broad range of industries, educational institutions, and research organizations.
EDAX instrumentation for elemental and structural analysis is found in a broad spectrum of industrial, academic, and government applications from the field or production line to the most advanced research and development laboratory. Typical markets served include semiconductor and microelectronics, academic and industrial R&D laboratories, RoHS/WEEE renewable energy, pharmaceuticals, mining, forensics, petrochemicals, metallurgy, and manufacturing operations.
EDAX headquarters is located in Mahwah, New Jersey, housing sales, engineering, technical support, and operations. EDAX is committed to providing the best possible support for our customers world-wide with sales, service, and applications support offices located in Japan, China, Singapore, The Netherlands, Germany, the United Kingdom, and the United States.
EDAX Inc.
91 McKee Drive
Mahwah, NJ 07430
TELEPHONE
(201) 529-4880
FAX
(201) 529-3156
E-MAILinfo.edax@ametek.com
WEB SITEwww.edax.com
YEAR FOUNDED
1962
Raman Spectroscopy and Deep Learning Enhances Blended Vegetable Oil Authentication
December 10th 2024Researchers at Yanshan University have developed a groundbreaking method combining Raman spectroscopy and deep learning models to accurately identify and quantify components in blended vegetable oils.
Measurement of Total Solar Reflectance Using UV/Vis/NIR Spectrophotometer According to ASTM E 903-20
December 10th 2024Using the LAMBDA 1050+ UV/Vis/NIR Spectrophotometer and ASTM E 903-20, this study measured Total Solar Reflectance (TSR) of paints. White had the highest TSR, dark green the lowest, optimizing materials for energy-efficient applications.