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2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th 10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis The Staples of the Modern Analytical Laboratory Chemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IR Effect of Sampling Optics on Raman Depth Profiling

2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis The Staples of the Modern Analytical LaboratoryChemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IREffect of Sampling Optics on Raman Depth Profiling

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2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th
10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis
The Staples of the Modern Analytical Laboratory
Chemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IR
Effect of Sampling Optics on Raman Depth Profiling

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X-ray Analysis
LIBS
Fluorescence

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Using NIR Spectroscopy as an Integrated PAT Tool (PDF)

December 1, 2004

This article summarizes recent efforts by the Duquesne University Center for Pharmaceutical Technology to develop and validate a PAT method using NIR spectroscopy for the on-line prediction of tablet hardness and active pharmaceutical ingredient content.

Using Information-Based Classifications to Distinguish Characteristics of Raw Agricultural Materials by Near-Infrared Spectroscopy

A Brush with Frequency Comb Spectroscopy: A Developing Story

Terahertz Spectral Characterization of Plasma Spray–Deposited Nickel Film on an Alumina Cylinder