
Top content published this week include a panel discussion with five SpecAcademy instructors and a feature article on Fourier transform infrared (FT-IR) spectroscopy.
The ability to easily characterize thin films by variable angle transmission and reflection is very important in both the design/development process and in the final production. This note presents the use of UV-Vis-NIR spectroscopy to characterize film samples in the full spectral region, from UV to NIR.





