Wavelength, May 2006
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May 2006
International Optical Design Conference
June 4-8, 2006
Vancouver, British Columbia, Canada
The 2006 Middle Atlantic Regional Meeting (MARM 2006)
June 4-7, 2006
Hershey, PA USA
Process Analytical Technology
June 6-8, 2006
New Brunswick, NJ
Short Course in Modern X-Ray Fluorescence Spectrometry (XRF2006)
June 12-23, 2006
London, Ontario, Canada
Cleaning Validation & Best Practices for Cleaning Processes
June 19-23, 2006
Las Vegas, NV
For more upcoming events, visit Spectroscopy's Calendar of Events page
Welcome to the May issue of The Wavelength. This month?s edition looks at emerging trends in mass spectrometry in a discussion with Jennifer Krone, PhD, product manager LC-MS with Hitachi High Technologies America, Inc. (Dallas, Texas) and Jack A. Syage, president of Syagen Technology, Inc. (Tustin, California). Also, we present you with the bonus of our MS supplement: Current Trends in Mass Spectrometry.
Click here to read the discussion.
Advances in the Separation and Detection of As, Cr, and Se Species in Potable Waters Using HPLC Coupled with Dynamic Reaction Cell ICP-MS
By Kenneth R. Neubauer , Pamela A. Perrone , Wilhad M. Reuter , Robert Thomas
High performance Mass Spectroscopy Begins with High-Performance Separations
By Georges L. Gauthier , Stefan Schuette , Christine A. Miller
Measurement of Metabolic Stability Using SIM and Identification of Metabolites by Data-Dependent full-Scan MS-MS and CNL Scanning
By Peter B. Ehmer, Ethisjulu Kantharaj, Katie De Wagter, Ann Van Vlaslaer, Claire Mackie, Ron A.H.J. Gilissen, Dipankar Ghosh, Karel Lazou
Performance Characterization of ion Detectors in Harsh Environments
By Bruce Laprade
Annual ASMS Conference Maintains its Appeal
By Prachi Patel-Predd
Acronyms in Mass Spectrometry
By Kenneth L. Busch
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Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
