X-Ray Fluorescence and the Pharmaceutical Industry: Implementing an Age-Old Technique
Wavelength-dispersive X-ray fluorescence (WDXRF) has for decades been widely implemented in quality control for many industries including, steel and alloy production, cement, plastics, glass, food, oil exploration and refining. It has been shown to be a highly stable, simple to operate, and reliable technique. In this podcast we will discuss the use of WDXRF, a direct analysis technique for the detection and quantification of elements/composition and elemental impurities in pharmaceuticals. On-going testing among various pharmaceutical companies has shown that it can be used to demonstrate compliance with regulations, such as ICH-Q3D and USP 232/233. However, this technique has not been fully exploited within this industry. Furthermore, we will discuss the ability to analyze final product as unadulterated pills in a non-destructive analysis.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
