Rigaku

Monday, November 14th, 2022 at 11am EST|8am PST|6pm IST Join us for this web seminar to learn about advanced hybrid metrology to optimize semiconductor R&D and high-volume manufacturing processes, including bump inspection in thin-film analysis, and thickness and composition measurements of AgSn micro solder bumps using a monochromatic micro X-ray beam.

Applied Rigaku Technologies recently launched a new, second-generation NEX CG II EDXRF spectrometer. What makes NEX CG II unique is its advanced Cartesian Geometry optical kernel. We want to briefly discuss the advances in EDXRF technology, and then discuss what this brings to users specifically when they use NEX CG II, a multi-element, Cartesian Geometry indirect excitation EDXRF system. We will also want to talk about applications where NEX CG II excels and why Cartesian Geometry EDXRF is advantageous for their analytical needs.

Prepare solid and liquid samples with TXRF. Ideal for ultra-trace elements at sub-ppm levels due to the optical configuration, which results in low-background noise.

Glenn Williams and Thanh Nguyen introduce the NANOHUNTER II Benchtop TXRF/GI-XRF analyzer for ultra-trace elemental analysis with minimal to no sample preparation. Ideal for applications spanning metallo-protein research to environmental assessment and thin-film metrology.

This application note demonstrates the performance for the analysis of organic chloride in crude per ASTM D4929 Part C using monochromatic EDXRF.

This application note demonstrates how WDXRF is a powerful tool for analyzing sulfur and metals in residual oil.

This application note demonstrates handheld Raman's ability to analyze polymorph transformations and thus differentiate them from each other.

This application note demonstrates whether the active pharmaceutical ingredient maintains its original crystal system, and whether there are polymorph impurities.

***Live: Tuesday February 23, 2021 & Wednesday February 24, 2021*** Spectroscopy magazine and the Society for Applied Spectroscopy (SAS) are pleased to present a joint virtual conference on February 23 and 24, 2021, called “Atomic Spectroscopy in Practice.” This two-day event will provide highly practical information for atomic spectroscopists and analytical laboratory staff working with molecular atomic techniques. *** On demand available after final airing until Feb. 24, 2022***

This application note describes a fast and simple means of obtaining elemental composition of unknown sample materials using the Rigaku NEX DE VS elemental spectrometer.

This application note demonstrates how to perform point and mapping analysis on the Rigaku ZSX Primus IV / Primus IVi general purpose WDXRF spectrometers.

This application note demonstrates the analysis of distinct polymorphs with the Rigaku Progeny 1064 nm handheld Raman analyzer.

This application note demonstrates the use of the SQX Scatter Fundamental Parameter (FP) method for the screening of materials difficult to analyze by conventional SQX.

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This report introduces an X-ray fluorescence (XRF) analysis for the detection of ppb levels of hazardous heavy elements in wastewater and river water using "Ultracarry®" high sensitivity micro-droplet filter paper and the "Ultradry™" vacuum dryer.