Application Notes: Atomic
Safe and Fast Determination of N/S/Cl Contents in Lactic Acid by Means of Organic Elemental Analysis v2
This application note describes a how to achieve quantitative digestion of lactic acid without soot formation in the shortest measurement time.
Fast and Reliable TS Determination in Liquefied Pressurized Gases (LPG) by Means of Elemental Analysis v2
This application note describes different application methods for the fast and reliable determination of widely varying sulfur contents.
Steel Carbon Gradient Characterization with Spectroscopy
This application note demonstrates how LECO’s GDS900 can be utilized to characterize carburized steel using the standard low alloy steel method for bulk analysis.
Chemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IR
XRD Quantitative Analysis of Polymorph Impurities
This application note demonstrates whether the active pharmaceutical ingredient maintains its original crystal system, and whether there are polymorph impurities.
Quantitative Analysis of Cannabis and Hemp with HR ICP-OES v2
This application note describes the analysis of heavy metals in cannabis with high sensitivity, precision, and accuracy using HR ICP-OES.
Industrial Forensics by Rigaku EDXRF
This application note describes a fast and simple means of obtaining elemental composition of unknown sample materials using the Rigaku NEX DE VS elemental spectrometer.
Diffraction Grating Masters for Spectroscopy Instrumentation
Inprentus offers custom-designed blazed diffraction grating masters with rights for replication. A variety of substrate materials and thin film overcoatings are available.
ICP-OES Analysis of High Matrix Samples
This application note demonstrates the robust analysis of 25% NaCl samples by ICP-OES. The analysis is simplified by using ceramic D-Torch and the sheath gas.
Mapping and Small Spot Analysis with General Purpose XRF
This application note demonstrates how to perform point and mapping analysis on the Rigaku ZSX Primus IV / Primus IVi general purpose WDXRF spectrometers.