Aligned semiconducting single-walled carbon nanotubes (s-SWCNTs) are expected to outperform silicon as the next generation of integrated circuits. Greater utilization of polarized Raman spectroscopy is proving beneficial for efficient characterization of alignment in CNT films. Here, we present the results of how polarized Raman imaging can be used to effectively characterize alignment in large regions of aligned s-SWCNT films.
