Dick Wieboldt

Aligned semiconducting single-walled carbon nanotubes (s-SWCNTs) are expected to outperform silicon as the next generation of integrated circuits. Greater utilization of polarized Raman spectroscopy is proving beneficial for efficient characterization of alignment in CNT films. Here, we present the results of how polarized Raman imaging can be used to effectively characterize alignment in large regions of aligned s-SWCNT films.

This information is a supplementary to the article “Polarized Raman Spectroscopy of Aligned Semiconducting Single-Walled Carbon Nanotubes” that was published in the June 2016 Spectroscopy supplemental issue Raman Technology for Today’s Spectroscopists (1).

The needs of the lithium-ion battery customers can be segmented into in situ and ex situ modes of analysis. In situ analysis allows researchers to follow changes in a battery cell during its charge and discharge cycles.

Today's Raman spectrometers are more capable than ever before. The seeds of innovation in filter, laser, and CCD technology have produced a crop of instruments that are fast, sensitive, and robust. This is good news because scientists are constantly bombarded with challenging problems that require the top performance from their instruments.