Author | Applied Rigaku Technologies, Inc.

Articles

Reference-free Thickness and Composition Analysis of ITO Thin Film by XRF

February 25, 2020

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This application note demonstrates the analysis of thin films, by X-ray fluorescence (XRF) with the fundamental parameters (FP) method.

The Analysis of Air Filters and Compliance with Instrument Sensitivity Requirements of U.S. EPA Method IO-3.3

January 27, 2020

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Analysis of air filters demonstrated by EDXRF indirect excitation with secondary targets and polarization in full Cartesian geometry.

Analysis of Hazardous Heavy Elements in Soil and Sediment

November 22, 2019

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Polluted soil negatively impacts the ecosystem. This application note demonstrates that a unique matrix correction that improves calibration accuracy for XRF analysis of heavy elements, including hazardous ones, in soil and sediment.