This study investigates the applicability of a quadrupole-based ICP-MS fitted with a dynamic reaction cell (DRC) to analyze high-purity phosphoric and sulfuric acid used in the semiconductor industry. It compares the DRC approach with traditional ICP-MS background reduction techniques to compensate for phosphorus- and sulfur-based interferences and presents data that suggests that the DRC technology can reach the next generation of semiconductor purity levels for these chemicals.
Analyzing Mercury Isotopes: A SciX Interview with Frank Vanhaecke, Part 2
October 17th 2024In this preview to the upcoming SciX 2024 conference next week, Spectroscopy sat down with Frank Vanhaecke to discuss about his educational background and what he is looking forward to about the upcoming conference.
Simultaneous Determination of 50 Elements in Geological Samples by ICP-MS Combined with ICP-OES
October 15th 2024A method combining inductively coupled plasma–mass spectrometry (ICP-MS) with inductively coupled plasma–optical emission spectrometry (ICP-OES) was developed for multielement determination of 50 species of major, minor, micro, and trace, rare earth, and rare elements in geological samples.