Characterization of Organic Light Emitting Diodes (OLED) by Spectroscopic Ellipsometry
OLED technology offers advantages to LCD technology: efficiency, high display quality, high contrast rate, lower energy consumption, etc. Ellipsometry, a non-destructive and sensitive optical technique, can provide information on performance improvements of these devices.
Best of the Week: SciX Award Interviews, Tip-Enhanced Raman Scattering
June 13th 2025Top articles published this week include an interview about aromatic–metal interactions, a tutorial article about the recent advancements in tip-enhanced Raman spectroscopy (TERS), and a news article about using shortwave and near-infrared (SWIR/NIR) spectral imaging in cultural heritage applications.
Hyperspectral Imaging for Walnut Quality Assessment and Shelf-Life Classification
June 12th 2025Researchers from Hebei University and Hebei University of Engineering have developed a hyperspectral imaging method combined with data fusion and machine learning to accurately and non-destructively assess walnut quality and classify storage periods.
